WIAS Technical Report No. 2, (2002)

Sampling techniques applicable for the characterization of the quality of self pulsations in semiconductor lasers


Authors

  • Radziunas, Mindaugas
    ORCID: 0000-0003-0306-1266

2010 Mathematics Subject Classification

  • 78-04 78-01 78A55

Keywords

  • Self pulsations, quality, locking, jitter

DOI

10.20347/WIAS.TECHREPORT.2

Abstract

The aim of the presented report is to demonstrate how the sampling techniques can be used to characterize the quality of self pulsations in a multi-section semiconductor laser and the synchronization of self pulsations with an optical or electrical periodically modulated signal. The developed tools are described and some examples are given.

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