Event
Location
Registration
Program
MMS Science Slam
Poster Session
Accommodation

Research

The Leibniz Research Network "Mathematical Modeling and Simulation" organizes the ninth Leibniz MMS Days, which will be hosted by the Leibniz Institute for High Performance Microelectronics Frankfurt/Oder (IHP).

The Workshop event aims to further develop MMS networking activities, presenting ongoing work using modern methods of MMS, and creates a plattform for discussion on topics of specific and general interest.

For information on previous workshops of this kind, we refer to our Leibniz MMS Days overview page.


Topics

We offer a platform for scientific exchange on MMS related topics at large. In doing so, synergies result not only from thematic overlaps, but above all from often similar problems and challenges in the most diverse scientific fields. To this end, in addition to the core scientific problems, we also address highly relevant horizontal aspects such as research software and data infrastructures, research data, reproducibility, or Open Science.

Besides plenary sessions of a more generally comprehensible character, special parallel workshops are planned around the particular scientific subjects

In addition, a mini-workshop on AI-supported scientific programming will be organised on Monday morning prior to the regular MMS Days.

For all the details of the program including titels and abstracts of the talks see here ».


Scientific Board


Contact

Contact at WIAS:
Torsten Koehler
WIAS, Knowledge Transfer
Anton-Wilhelm-Amo Str. 39, 10117 Berlin,
Phone: +49-30 20372-582

Contact at IHP:
Costanza Manganelli
Leibniz Institute for High Performance Microelectronics
Im Technologiepark 25
15236 Frankfurt (Oder)
Phone: +49 335 5625-297


Organized by

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Header image: Results of an investigation about the interplay between temperature, strain and energy in tensile-strained Germanium microdisks. The comparison between experimentally obtained and theoretically investigated photo-luminescence spectra offer design rules for the analysis of their optical emission.