Electromagnetics - Modelling, Simulation, Control and Industrial Applications - Abstract

Srivastava, Tanuja

Reconstruction algorithm for discrete binary functions from two orthogonal projections

Finding analytical solution inverse electromagnetic scattering problems is difficult due to its irregular geometries. Here an attempt is made to solve the inverse problem in discrete model with application in nondestructive testing in industrial applications. The basic assumption has been taken that the material is modeled as binary function and measurements received are modeled as line (or strip) sums along some given directions, covering the area of reconstruction. In this case if we change the direction from usual horizontal and vertical to diagonals (in the sense of matrices) the proposed algorithms provide much better results. in present talk the consistency, uniqueness and solution (reconstruction algorithm) of the problem is discussed.